Sample analysis using low resolution Raman spectroscopy

Details Sample analysis using low resolution Raman spectroscopy Sample analysis using low resolution Raman spectroscopy

1998-02-26

1999-11-09

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

With raman type light scattering

G01J 344, G01N 2165

Patent

active

059824840

ABSTRACT:
The present invention provides an apparatus for measuring a property of a sample using low resolution Raman spectroscopy. The apparatus includes a multi-mode laser element, a wavelength dispersion element, a detector, and a processor. The multi-mode laser element irradiates a sample with laser radiation to produce a Raman spectrum. The collection element collects the radiation scattered from the molecules of the sample and transmits the scattered radiation to the dispersion element. The dispersion element disperses the scattered radiation into different wavelength components. The detection array detects the different wavelength components. A processor processes data from the detector array to identify a constituent or to measure a property of the sample. The apparatus preferably has a resolution of between 30 cm.sup.-1 and 50 cm.sup.-1. The resolution of the apparatus being determined in part by the spectral full width at half maximum of the multi-mode laser, and, in part, by the dispersion element.

REFERENCES:
patent: 5139334 (1992-08-01), Clarke
patent: 5370790 (1994-12-01), Maggard et al.
patent: 5377004 (1994-12-01), Owen et al.
patent: 5455673 (1995-10-01), Alsmeyer et al.
patent: 5652653 (1997-07-01), Alsmeyer et al.

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