Sample analysis using cantilever probe

Details Sample analysis using cantilever probe Sample analysis using cantilever probe

2008-06-12

2010-10-05

Raevis, Robert R (Department: 2856)

Measuring and testing

Sampler, sample handling, etc.

Capture device

Reexamination Certificate

active

07806008

ABSTRACT:
A method and apparatus for analysis of a sample. The method includes an accessing operation for accessing a region of the sample via a tip of at least one probe mounted on a cantilever. A removing operation removes a sample material from the region that is accessed by the tip of the at least one probe mounted on the cantilever. A sensing operation senses a parameter associated to the removal of the sample material in the removing operation. The accessing, removing, and sensing operations are repeated to facilitate removal of at least one layer of the sample.

REFERENCES:
patent: 6078174 (2000-06-01), Mukasa
patent: 6249747 (2001-06-01), Binnig
patent: 6546788 (2003-04-01), Magerle
patent: 7107826 (2006-09-01), Watanabe et al.
patent: 7375324 (2008-05-01), Linder et al.
patent: 2001/0052257 (2001-12-01), Magerle
patent: 2003/0094035 (2003-05-01), Mitchell

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