Safety decive for integrated circuit

Details Safety decive for integrated circuit Safety decive for integrated circuit

1990-01-22

1993-03-02

Pellinen, A. D.

Electricity: electrical systems and devices

Safety and protection of systems and devices

361 56, H01L 2704

Patent

active

051914980

ABSTRACT:
Phenomena of unwanted programming, caused by the substrate currents of an integrated circuit, are prevented by providing for a measurement of these currents and for a circuit invalidating the operation of the integrated circuit when the result of this measurement goes beyond a certain threshold. In a preferred way, the measurement of the substrate current is obtained by making a bipolar type transistor, the base region of which is formed precisely by this substrate, or by making a a field-effect type of transistor, the gate of which and one of the active regions of which are connected to the ground terminal of the circuit. But theses two connections are different. One of the connections is direct while the other is a connection subjected to the fluctuations in the potential of the substrate.

REFERENCES:
patent: 4811155 (1989-03-01), Kuriyama
patent: 4829350 (1989-05-01), Miller
patent: 4924339 (1990-05-01), Astumi et al.

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