Safety circuit for a semiconductor element

Details Safety circuit for a semiconductor element Safety circuit for a semiconductor element

1978-12-20

1981-01-06

Edlow, Martin H.

Electricity: electrical systems and devices

Safety and protection of systems and devices

With specific current responsive fault sensor

357 38, 357 51, 361 11, 361 58, H01L 2356

Patent

active

042439981

ABSTRACT:
The negative temperature coefficient effect, which results in destructive current flow above a certain temperature in a semiconductor device is counteracted by a layer of conductive material that has low resistance at normal temperatures but has a positive temperature coefficient that causes its resistance to rise to a high value at temperatures below the certain temperature. The layer is applied to electrodes of semiconductor devices to control current flowing therethrough.

REFERENCES:
patent: 3708720 (1973-01-01), Whitney
patent: 3893154 (1975-07-01), Mroczek

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