Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
Reexamination Certificate
2011-05-17
2011-05-17
Rossoshek, Helen (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Logic design processing
C716S100000, C716S101000, C716S106000, C716S107000, C716S109000, C716S110000, C716S111000, C716S117000, C716S136000, C703S014000, C703S020000, C703S022000
Reexamination Certificate
active
07945878
ABSTRACT:
A method to validate data used in a design of a semiconductor product currently in a partially fabricated state is disclosed. The partially fabricated state having a plurality of layers up to and including a first conductive layer. The method generally includes the steps of (A) adding a second conductive layer from a user specification to an application set, the application set having a plurality of resources that define the semiconductor product, (B) validating a new resource in the user specification against the resources in the application set, (C) adding the new resource to the application set upon passing the validating and (D) propagating the new resource throughout a description of the semiconductor product, the description being stored in a computer-readable medium.
REFERENCES:
patent: 5128871 (1992-07-01), Schmitz
patent: 5452239 (1995-09-01), Dai et al.
patent: 5603043 (1997-02-01), Taylor et al.
patent: 5966707 (1999-10-01), Van Huben et al.
patent: 6216258 (2001-04-01), Mohan et al.
patent: 6243851 (2001-06-01), Hwang et al.
patent: 6260182 (2001-07-01), Mohan et al.
patent: 6292925 (2001-09-01), Dellinger et al.
patent: 6385757 (2002-05-01), Gupta et al.
patent: 6389379 (2002-05-01), Lin et al.
patent: 6408428 (2002-06-01), Schlansker et al.
patent: 6457164 (2002-09-01), Hwang et al.
patent: 6539520 (2003-03-01), Tiong et al.
patent: 6584601 (2003-06-01), Kodosky et al.
patent: 6675306 (2004-01-01), Baxter
patent: 6742165 (2004-05-01), Lev et al.
patent: 6789054 (2004-09-01), Makhlouf
patent: 6823497 (2004-11-01), Schubert et al.
patent: 6823502 (2004-11-01), Wingren et al.
patent: 6868534 (2005-03-01), Fattouh et al.
patent: 6901563 (2005-05-01), Ogami et al.
patent: 6909330 (2005-06-01), Colleran et al.
patent: 6910201 (2005-06-01), Byrn et al.
patent: 6938236 (2005-08-01), Park et al.
patent: 6964029 (2005-11-01), Poznanovic et al.
patent: 6988251 (2006-01-01), Vogel
patent: 7003423 (2006-02-01), Kabani et al.
patent: 7020852 (2006-03-01), Oeltjen et al.
patent: 7032190 (2006-04-01), Auracher et al.
patent: 7036106 (2006-04-01), Wang et al.
patent: 7039885 (2006-05-01), Mohan
patent: 7050807 (2006-05-01), Osborn
patent: 7055113 (2006-05-01), Broberg et al.
patent: 7062736 (2006-06-01), Oleksinski et al.
patent: 7069523 (2006-06-01), Nation et al.
patent: 7080267 (2006-07-01), Gary et al.
patent: 7188330 (2007-03-01), Goyal
patent: 7216312 (2007-05-01), Jain et al.
patent: 7240303 (2007-07-01), Schubert et al.
patent: 7404156 (2008-07-01), Youngman et al.
patent: 2003/0121010 (2003-06-01), Aubury
patent: 2004/0128626 (2004-07-01), Wingren et al.
patent: 2004/0261052 (2004-12-01), Perry et al.
patent: 2005/0080502 (2005-04-01), Chernyak et al.
patent: 2005/0114818 (2005-05-01), Khakzadi et al.
patent: 2005/0204316 (2005-09-01), Nebel et al.
patent: 2005/0223347 (2005-10-01), Okuaki
patent: 2005/0240892 (2005-10-01), Broberg et al.
patent: 2005/0273738 (2005-12-01), Byrn et al.
patent: 2005/0278670 (2005-12-01), Brooks et al.
patent: 2006/0178862 (2006-08-01), Chan et al.
patent: 2008/0263480 (2008-10-01), Youngman et al.
Nordman John Emery
Senst Scott T.
Youngman Todd Jason
LSI Corporation
Maiorana PC Christopher P.
Rossoshek Helen
LandOfFree
Rules and directives for validating correct data used in the... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Rules and directives for validating correct data used in the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Rules and directives for validating correct data used in the... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2672346