RTP lamp design for oxidation and annealing

Coating apparatus – Gas or vapor deposition – With treating means

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392411, 392418, 392422, C23L 1600

Patent

active

057627134

ABSTRACT:
A RTP system and method. A first lamp zone (108) is located around a periphery of a wafer (102) for heating the center of the wafer (102) and a second lamp zone (114) is located around the periphery of the wafer (102) for heating the edge of the wafer (102). The chamber (104) includes highly reflective surfaces (106). Light from the first and second lamp zones (108, 114) is reflected off of the highly reflective surfaces (106) at least three time before reaching the wafer (102). Thus, the wafer (102) is isotropically heated and uniform wafer heating is achieved.

REFERENCES:
patent: 4956538 (1990-09-01), Moslehi
patent: 5418885 (1995-05-01), Hauser
Websters 3.sup.rd New International Dictionary, Merriam-Webster, Springfield Mass, 1993, p. 1681.

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