Measuring and testing – Gas analysis – Moisture content or vapor pressure
Patent
1976-08-26
1978-07-25
Queisser, Richard C.
Measuring and testing
Gas analysis
Moisture content or vapor pressure
364557, G01K 724
Patent
active
041021991
ABSTRACT:
A method of measuring temperature utilizing resistance temperature detectors (RTDs) is disclosed. A number of RTDs are sequentially scanned and their resistance values are processed by zeroing and linearizing circuit techniques so that an output signal directly proportional to the temperature of each RTD is obtained. The scanning technique incorporates constant current excitation so that complete linearization of the resistance versus temperature function is made possible with very few high tolerance components.
REFERENCES:
patent: 3363462 (1968-01-01), Sabin
patent: 3651696 (1972-03-01), Rose
patent: 3843872 (1974-10-01), Shimomura
patent: 3854039 (1974-12-01), Serrano
patent: 3906796 (1975-09-01), Dumbeck
Appleman John S.
Megasystems, Inc.
Queisser Richard C.
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