Roundness measuring device, method and program for measuring...

Details Roundness measuring device, method and program for measuring... Roundness measuring device, method and program for measuring...

2008-05-16

2009-12-22

Dunn, Drew A (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Dimensional determination

C702S167000, C702S169000, C033S503000, C033S543000, C033S550000

Reexamination Certificate

active

07636646

ABSTRACT:
A roundness measuring device includes: an eccentric position calculation unit calculating, based on a measured distance and a measured angle, a distance between a axis of the measured object and a rotation axis as an eccentric distance, and calculating an angle formed between the detection line and a line segment connecting the rotation axis and the axis of the measured object as an eccentric angle; and a measurement correction unit correcting the measured distance based on the eccentric distance, the eccentric angle, the measured angle, a radius of the measured object, and a length from the center to the surface of the detector unit, and correcting the measured angle by adding a correction angle to the measured angle, the correction angle being formed between the detection line and a line segment connecting the rotation axis and a contact point where the measured object and the detector unit come in contact with one another.

REFERENCES:
patent: A-04-329306 (1992-11-01), None
patent: A-05-269649 (1993-10-01), None
patent: A-08-122050 (1996-05-01), None
patent: A-2004-093529 (2004-03-01), None
patent: A-2004-108787 (2004-04-01), None

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