Roughness measuring apparatus

Details Roughness measuring apparatus Roughness measuring apparatus

1985-11-25

1987-06-16

LaRoche, Eugene R.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250228, 356124, G01B 900

Patent

active

046738185

ABSTRACT:
A surface roughness measuring apparatus employing a molded Coblentz Sphere and a pair of matched photovoltaic sensors of wafer-thin rectangular configuration to allow the sensor used to detect specular reflection, to be used also as a reflector for directing a sample orienting beam to a screen and to avoid intrusion of the sensor used to detect scatter light into the sphere. The apparatus is contained in a console having an unobstructed top surface on which a sample may be placed. Also, a remote sample mounted sensing head may be attached to the console for use with large samples.

REFERENCES:
patent: 2171433 (1939-08-01), Powers
patent: 2363700 (1944-11-01), Soetbeer
patent: 3277773 (1966-10-01), White
patent: 3545871 (1970-12-01), Waska
patent: 3947127 (1976-03-01), Bennett et al.
patent: 3971956 (1976-07-01), Jakeman et al.
patent: 4364663 (1982-12-01), Gardner et al.
patent: 4626101 (1986-12-01), Ogawa et al.
Description of Model 201 Portable Scatterometer by Talandic Research Corp.

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