Rotation angle measuring with overlap area is between two optica

Details Rotation angle measuring with overlap area is between two optica Rotation angle measuring with overlap area is between two optica

1990-03-02

1991-11-12

Willis, Davis L.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

2502311H, 356 37H, H01J 4014

Patent

active

050650149

ABSTRACT:
A method and apparatus for measuring a rotation angle. At least one rotatable optical grating is provided to be pivotal on a rotation axis relative to one or more slits parallel to the rotatable optical grating. The rotatable optical grating is radial to the rotation axis. To measure a rotation angle the rotatable optical grating is pivoted relative to at least one stationary optical grating which is radial to a center opposite to a center of the rotatable optical grating. An overlap area is defined between the two optical gratings and measurement of the relative movement between the rotatable optical grating and the stationary optical grating is detected by at least one photoelectric receiver.

REFERENCES:
patent: 3944821 (1976-03-01), Pierrat
Shunsuke Yokozeki--Optics Communications--vol. 11, No. 4 Aug. 1974.

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