Rotation angle detector

Electricity: measuring and testing – Magnetic – Displacement

Reexamination Certificate

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C324S207200

Reexamination Certificate

active

07391207

ABSTRACT:
A rotation angle detector detects a rotation angle of a magnetic field by selectively using a hall element from a plurality of hall elements disposed on one side of a semiconductor substrate. The hall elements are equiangularly disposed to each other in a ring shape. The rotation angle of the magnetic field is detected by using a portion of an output signal of the hall element having a substantially linear output characteristic.

REFERENCES:
patent: 4283679 (1981-08-01), Ito et al.
patent: 4642496 (1987-02-01), Kerviel et al.
patent: 4668914 (1987-05-01), Kersten et al.
patent: 4873655 (1989-10-01), Kondraske
patent: 4875011 (1989-10-01), Namiki et al.
patent: 5614754 (1997-03-01), Inoue
patent: 5769249 (1998-06-01), Lascara
patent: 5796249 (1998-08-01), Andräet al.
patent: 5880586 (1999-03-01), Dukart et al.
patent: 6104231 (2000-08-01), Kirkpatrick, II
patent: 6201389 (2001-03-01), Apel et al.
patent: 6288533 (2001-09-01), Haeberli et al.
patent: 6326780 (2001-12-01), Striker
patent: 6492697 (2002-12-01), Plagens et al.
patent: 6545462 (2003-04-01), Schott et al.
patent: 6937012 (2005-08-01), Saito
patent: 6969988 (2005-11-01), Kakuta et al.
patent: 7053609 (2006-05-01), Saito
patent: 7119538 (2006-10-01), Blossfeld
patent: 7208940 (2007-04-01), Withanawasam et al.
patent: 2002/0190709 (2002-12-01), Frederick et al.
patent: 2003/0128026 (2003-07-01), Lutz
patent: A-61-223572 (1986-10-01), None
patent: A-2-128103 (1990-05-01), None
patent: A-4-302406 (1992-10-01), None
patent: A-7-162055 (1995-06-01), None
patent: A-8-005312 (1996-01-01), None
patent: A-2001-349747 (2001-12-01), None
patent: A-2002-116055 (2002-04-01), None
patent: A-2002-323345 (2002-11-01), None
patent: A-2004-012156 (2004-01-01), None
patent: A-2005-172527 (2005-06-01), None
Notification of Reasons for Rejection (with English translation) and citations dated Jul. 18, 2007 issued in the corresponding Japanese patent application No. 2005-151589.
S. Kawahito et al. “MOS Hall Elements with Three-Dinemsional Microstructure.” Transducers 93', 1993. The 7thInternational Conference on Solid-State Sensors and Actuators, pp. 892-895. (discussed on p. 1 in the specification).

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