Electricity: measuring and testing – Magnetic – Displacement
Reexamination Certificate
2008-06-24
2008-06-24
Aurora, Reena (Department: 2862)
Electricity: measuring and testing
Magnetic
Displacement
C324S207200
Reexamination Certificate
active
07391207
ABSTRACT:
A rotation angle detector detects a rotation angle of a magnetic field by selectively using a hall element from a plurality of hall elements disposed on one side of a semiconductor substrate. The hall elements are equiangularly disposed to each other in a ring shape. The rotation angle of the magnetic field is detected by using a portion of an output signal of the hall element having a substantially linear output characteristic.
REFERENCES:
patent: 4283679 (1981-08-01), Ito et al.
patent: 4642496 (1987-02-01), Kerviel et al.
patent: 4668914 (1987-05-01), Kersten et al.
patent: 4873655 (1989-10-01), Kondraske
patent: 4875011 (1989-10-01), Namiki et al.
patent: 5614754 (1997-03-01), Inoue
patent: 5769249 (1998-06-01), Lascara
patent: 5796249 (1998-08-01), Andräet al.
patent: 5880586 (1999-03-01), Dukart et al.
patent: 6104231 (2000-08-01), Kirkpatrick, II
patent: 6201389 (2001-03-01), Apel et al.
patent: 6288533 (2001-09-01), Haeberli et al.
patent: 6326780 (2001-12-01), Striker
patent: 6492697 (2002-12-01), Plagens et al.
patent: 6545462 (2003-04-01), Schott et al.
patent: 6937012 (2005-08-01), Saito
patent: 6969988 (2005-11-01), Kakuta et al.
patent: 7053609 (2006-05-01), Saito
patent: 7119538 (2006-10-01), Blossfeld
patent: 7208940 (2007-04-01), Withanawasam et al.
patent: 2002/0190709 (2002-12-01), Frederick et al.
patent: 2003/0128026 (2003-07-01), Lutz
patent: A-61-223572 (1986-10-01), None
patent: A-2-128103 (1990-05-01), None
patent: A-4-302406 (1992-10-01), None
patent: A-7-162055 (1995-06-01), None
patent: A-8-005312 (1996-01-01), None
patent: A-2001-349747 (2001-12-01), None
patent: A-2002-116055 (2002-04-01), None
patent: A-2002-323345 (2002-11-01), None
patent: A-2004-012156 (2004-01-01), None
patent: A-2005-172527 (2005-06-01), None
Notification of Reasons for Rejection (with English translation) and citations dated Jul. 18, 2007 issued in the corresponding Japanese patent application No. 2005-151589.
S. Kawahito et al. “MOS Hall Elements with Three-Dinemsional Microstructure.” Transducers 93', 1993. The 7thInternational Conference on Solid-State Sensors and Actuators, pp. 892-895. (discussed on p. 1 in the specification).
Aurora Reena
Denso Corporation
Posz Law Group , PLC
Whittington Kenneth J.
LandOfFree
Rotation angle detector does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Rotation angle detector, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Rotation angle detector will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2799662