Rotation angle detecting device and torque detecting device

Measuring and testing – Dynamometers – Responsive to torque

Reexamination Certificate

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Reexamination Certificate

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06988421

ABSTRACT:
A rotation angle detecting device and a torque detecting device, which can prevent waveforms to be outputted from a plurality of semiconductor MR elements, from dispersing due to the material difference of a semiconductor wafer. A plurality of semiconductor MR elements are formed over a common cell of a semiconductor wafer and are arranged to confront at such positions different from each other in a target circumferential direction with respect to corresponding input and output shafts that signals to be outputted according to the rotations of the input and output shafts to be detected may establish a predetermined phase difference in an electrical angle.

REFERENCES:
patent: 5260653 (1993-11-01), Smith et al.
patent: 5561368 (1996-10-01), Dovek et al.
patent: 6031372 (2000-02-01), Van Den Berg
patent: 2002/0020229 (2002-02-01), Nakamura et al.
patent: 195 36 433 (1997-10-01), None
patent: 199 33 243 (2000-02-01), None
patent: 61-223525 (1986-10-01), None
patent: 2002-82002 (2002-03-01), None
patent: 2002 082002 (2002-03-01), None
Search Report dated Apr. 14, 2005.

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