Optics: measuring and testing – Material strain analysis – With polarized light
Patent
1977-09-20
1979-12-04
Corbin, John K.
Optics: measuring and testing
Material strain analysis
With polarized light
356365, G01J 404, G01L 124
Patent
active
041769511
ABSTRACT:
An ellipsometer for measuring the polarization parameters .alpha. and .lambda. of an elliptically polarized light wave. The light wave passes successively through an orientable quarter-wave plate, a birefringent plate rotatable at a constant speed .omega. and a polarizer and then impinges upon a photodetector. Reference signals having angular frequencies of 2.omega. and 4.omega. are generated, one of these signals being employed to synchronously detect the signal at the output of the photodetector by adjusting the quarter-wave plate until the synchronously detected signal component is zero, the orientation of the quarter-wave plate then corresponding to the polarization parameter .alpha.. The parameter .lambda. is obtained by measuring the phase of the component at the output of the photodetector having an angular frequency of 4.omega..
The invention applies in particular to photoelasticimetry.
REFERENCES:
patent: 3738755 (1973-06-01), Chaney et al.
patent: 3740151 (1973-06-01), Chaney et al.
patent: 3902805 (1975-09-01), Redner
patent: 3927947 (1975-12-01), Kasai
patent: 3988067 (1976-10-01), Yamamoso et al.
Redner, S. "New Automatic Polariscope System", Experimental Mechanics, vol. 4, No. 12, Dec. 1974, pp. 486-491.
Bourdon Claude G.
Chorlay Etienne G.
Euzenade Jean-Louis
Msika Nessim C.
Robert Andre J.
Corbin John K.
Etat Francais as represented by the Pelegue General pour l'Armem
Rosenberger R. A.
LandOfFree
Rotating birefringent ellipsometer and its application to photoe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Rotating birefringent ellipsometer and its application to photoe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Rotating birefringent ellipsometer and its application to photoe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-89358