X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Patent
1990-10-31
1992-06-02
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Computerized tomography
378 10, 378 20, 378 58, G01N 2302
Patent
active
051194082
ABSTRACT:
A method for inspecting a component having dimensions larger than a fan beam angle of an x-ray inspection system includes the steps of: providing an x-ray beam having a selected fan angle in a source focal point; positioning a portion of the component substantially completely within the x-ray beam; rotating the component 360 degrees around a component inspection rotational axis; collecting the attenuated x-ray beam that passes through the component during rotation; generating a multiplicity of electrical signals responsive to the collected x-ray beam; incrementally moving the component inspection rotational axis about the x-ray source focal point to position another portion of the component within the x-ray beam; and repeating the steps of rotating the part 360 degrees about a component inspection rotational axis and incrementally moving the part inspection rotational axis about the x-ray source focal point until the entire component has passed through the fan beam.
REFERENCES:
patent: 3766387 (1973-10-01), Heffan et al.
patent: 4422177 (1983-12-01), Mastronardi et al.
patent: 4600998 (1986-07-01), Huet
patent: 4989225 (1991-01-01), Gupta et al.
Galish Andrew J.
Isaacs Ralph G.
Little Francis H.
General Electric Company
Howell Janice A.
Moore, Jr. Charles L.
Porta David P.
Squillaro Jerome C.
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