Rotary position measuring system

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

06885457

ABSTRACT:
A rotary position measuring system having a housing connected with a scanning unit having a light source that emits beams of light and a detector element. A reflection scanning graduation structure arranged directly on the housing opposite the scanning unit. A graduated disk is connected with a rotatable shaft and has a radial transmission measuring graduation structure, wherein the graduated disk is arranged so it is rotatable around an axis of symmetry in the housing so that the measuring graduation structure is located between the scanning unit and the scanning graduation structure. The beams of light emitted by the light source first reach the measuring graduation structure where they are split into a first set of diffracted partial beams of different orders and the diffracted partial beams impinge on the scanning graduation structure. A second set of diffracted partial beams of different orders results and a back-reflection of the second set of diffracted partial beams in the direction toward the measuring graduation structure results, where the second set of diffracted partial beams interfere with one another and the detection of interfering partial beams takes place by the detector element.

REFERENCES:
patent: 4156137 (1979-05-01), Nelle
patent: 4171160 (1979-10-01), Ernst
patent: 4176276 (1979-11-01), Kaul et al.
patent: 4243325 (1981-01-01), Ernst
patent: 4423958 (1984-01-01), Schmitt
patent: 4495700 (1985-01-01), Ernst
patent: 4530155 (1985-07-01), Burkhardt et al.
patent: 4530159 (1985-07-01), Ernst
patent: 4616131 (1986-10-01), Burkhardt
patent: 4641027 (1987-02-01), Renner et al.
patent: 4700062 (1987-10-01), Ernst
patent: 4776701 (1988-10-01), Pettigrew
patent: 4815850 (1989-03-01), Kanayama et al.
patent: 5021735 (1991-06-01), Maass et al.
patent: 5079418 (1992-01-01), Michel et al.
patent: 5336884 (1994-08-01), Khoshnevisan et al.
patent: 5428445 (1995-06-01), Holzapfel
patent: 5451776 (1995-09-01), Kolloff et al.
patent: 5493399 (1996-02-01), Meyer et al.
patent: 5661296 (1997-08-01), Ishizuka et al.
patent: 5663794 (1997-09-01), Ishizuka
patent: 5666196 (1997-09-01), Ishii et al.
patent: 5689336 (1997-11-01), Huber
patent: 5716679 (1998-02-01), Krug et al.
patent: 5774219 (1998-06-01), Matsuura
patent: 5977539 (1999-11-01), Holzapfel et al.
patent: 6005667 (1999-12-01), Takamiya et al.
patent: 6154278 (2000-11-01), Ito et al.
patent: 37 02 203 (1987-07-01), None
patent: 36 09 211 (1987-09-01), None
patent: 39 00 464 (1990-07-01), None
patent: 0 163 362 (1985-12-01), None
patent: 0 564 683 (1993-10-01), None
patent: 0 577 104 (1994-01-01), None
patent: 0 735 346 (1996-10-01), None
patent: WO 9306508 (1993-04-01), None
“Langen in der Ultraprazisionstechnik messen Length measuring in Ultra-Precision Technology,” by A. Spiess, Feinwerktechnik & Messtechnik 98 [Precision Mechanics & Measuring Technology 98], vol. 10, pp. 406-410 (1990).
English language Abstract of West German reference 36 09 211.
English language Abstract of German reference 37 02 203.
English language Abstract of German reference 39 00 464.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Rotary position measuring system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Rotary position measuring system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Rotary position measuring system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3407034

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.