Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1980-10-02
1983-09-06
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 1, 356376, G01B 1100, G01C 300
Patent
active
044026080
ABSTRACT:
An arrangement for obtaining three-dimensional position data on surfaces defining a room, and objects enclosed by that room. The room is scanned with a master and slave sensors to determine the three-dimensional profiles of surfaces that are visible to the sensors. A pattern is then projected by the master sensor onto a known surface, and slave sensors spaced from the master sensor search for that pattern. The position of the pattern is determined angularly by each slave sensor, and the projection of the pattern is thereafter discontinued. Each salve sensor then measures the distance to the known surface at that angle with respect to its own coordinate system. This is repeated three times so that three such patterns are located. The position data from all of the sensors are transformed into a single common coordinate system, based upon sensor locations determined by the measurement of the three patterns.
REFERENCES:
patent: 3633010 (1972-01-01), Svetlichny
patent: 4145991 (1979-03-01), DiMatteo et al.
Gillespie, W. M.; Land-Surveying, Part VII, Chapter III, "Obsticals to Measurement," pp. 287-296; dated 1855.
DiMatteo Paul
Rademacher Paul
Fogiel Max
Rosenberger R. A.
Solid Photography Inc.
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