Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1997-07-11
1998-12-15
Font, Frank G.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356382, 356345, G01B 902
Patent
active
058502874
ABSTRACT:
An apparatus for measuring the thickness of a film on a production line or the like. The apparatus includes a moveable member in contact with the film. The moveable member rotates about a fixed member and includes a transparent region. The apparatus also includes an optical probe attached to the fixed member. The optical probe has an optical fiber for coupling a light signal to the film through the transparent region of the moveable member and for returning light reflected from the film to a receiver for determining the thickness of the film. The optical probe may also include a lens assembly for imaging the light signal onto the film and imaging the reflected light signals back into the optical probe. The optical probe may also include a partially reflecting reference reflector for simplifying the analysis of multi-layer films.
REFERENCES:
patent: 4937449 (1990-06-01), Kreuzer et al.
patent: 5731876 (1998-03-01), Venkatesh et al.
Heffner Brian L.
Sorin Wayne V.
Venkatesh Shalini
Font Frank G.
Hewlett--Packard Company
Lee Andrew H.
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