Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1986-02-03
1987-10-27
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 1, 356376, G01B 1124
Patent
active
047026057
ABSTRACT:
An arrangement for scanning the measurement field of view of a three-dimensional measurement system, in which the measurement system is pivoted through a relatively small motion to scan a relatively large area of volume. The measurement system is rotated via a control unit which accurately controls the rotation. Mathematical corrections are applied to determine the true measured coordinates.
REFERENCES:
patent: 4402608 (1983-09-01), DiMatteo et al.
patent: 4652749 (1987-03-01), Stern
Rioux, Applied Optics, vol. 23, No. 21, Nov. 1, 1984, pp. 3837-3844.
Mauro Alex
Stern Howard
Evans F. L.
Fogiel Max
Robotic Vision Systems Inc.
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