Image analysis – Pattern recognition – Classification
Patent
1995-07-31
1998-04-28
Johns, Andrew
Image analysis
Pattern recognition
Classification
382228, G06K 900
Patent
active
057456011
ABSTRACT:
A classifier measures robustness responsive to object presentation effects and decision boundary effects. A cytological image analysis computer obtains objects of interest and classifies them responsive to a decision tree classifier. The robustness of classification is calculated dynamically as objects are classified responsive to a segmentation robustness and a classification decisiveness measure. The results of the decisiveness measure and the segmentation robustness data are combined to provide enhanced overall classification reliability.
REFERENCES:
patent: 3824393 (1974-07-01), Brain
patent: 4034342 (1977-07-01), Kruklitis
patent: 4085006 (1978-04-01), Mindick et al.
patent: 4175860 (1979-11-01), Bacus
patent: 4812412 (1989-03-01), Turner
patent: 4839194 (1989-06-01), Malluche et al.
patent: 4949388 (1990-08-01), Bhaskaram
patent: 4965725 (1990-10-01), Rutenberg
patent: 5029226 (1991-07-01), Klein et al.
patent: 5048095 (1991-09-01), Bhanu et al.
patent: 5072382 (1991-12-01), Kamentsky
patent: 5077807 (1991-12-01), Bokser
patent: 5078952 (1992-01-01), Gozani et al.
patent: 5139031 (1992-08-01), Guirguis
patent: 5153439 (1992-10-01), Gozani et al.
patent: 5257182 (1993-10-01), Luck et al.
patent: 5260871 (1993-11-01), Goldberg
patent: 5263097 (1993-11-01), Katz et al.
patent: 5287272 (1994-02-01), Rutenberg et al.
patent: 5313532 (1994-05-01), Harvey et al.
patent: 5315700 (1994-05-01), Johnston et al.
patent: 5317653 (1994-05-01), Eschbach et al.
patent: 5335291 (1994-08-01), Kramer et al.
patent: 5357977 (1994-10-01), Michels
patent: 5361140 (1994-11-01), Hayenga et al.
patent: 5487117 (1996-01-01), Burges et al.
Chow et al., "Robustness Test of an Incipient Fault Detector Artificial Neural Network", Department of Electrical and Computer Engineering, North Carolina State University, Raleigh, NC, 27695-7911, pp. I-73 -I-78, International Joint Conference on Neural Networks, Jul. 8-12, 1991 proceedings, .COPYRGT.1991 IEEE.
McAulay et al., "Robust Aircraft Classification Using Moment Invariants, Neural Network, and Split Inversion Learning", Wright State University, Dept. of Computer Science and Engineering, Dayton, OH 45435, International Joint Conference on Neural Networks, Jul. 8-12, 1991 proceedings, Abstract only.
Zhou et al., "A Statistical-Heuristic Feature Selection Criterion for Decision Tree Induction", pp. 834-841, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 13, No. 8, Aug. 1991, .COPYRGT.1991, IEEE.
Bacus, James W. and Les J. Grace, "Optical Microscope System For Standardized Cell Measurements and Analyses", Applied Optics, 26:16, pp. 3280-3293, 15 Aug. 1987.
Bartels, Peter H., et al., "A Self-Learning Computer Program for Cell Recognition", ACTA Cytologica: The Journal of Clinical Cytology, 14:8, pp. 486-494, Oct. 1970.
Tanaka, Noboru, et al., "Automated Cytologic Screening System (CYBEST Model 4): an Integrated Image Cytometry System", Reprinted from Applied Optics, vol. 26, No. 16, pp. 3301-3307, Aug. 15, 1987. Copyright.COPYRGT. 1987 by the Optical Society of America and reprinted by permission of the copyright owner.
Duda, Richard O. and Peter E. Hart, "Fisher's Linear Discriminant", Patent Classification and Scene Analysis, Copyright .COPYRGT.1973, pp. 114-119.
Dytch, Harvey E. et al., "An Interactive Microcomputer-Based System for the Quantitative Analysis of Stratified Tissue Sections", Analytical and Quantitative Cytology and Histology, vol. 9, No. 1, pp. 69-78, Mar. 1987.
Enslein, Kurt and Peter W. Neurath, "Augmented Stepwise Discriminant Analysis Applied to Two Classification Problems in the Biomedical Field", Computers and Biomedical Research, 2, 568-581 (1969).
Kurman, Robert J. et al., "Part 1: Specimen Adequacy" and Part 2: Descriptive Diagnoses, The Bethesda System for Reporting Cervical/Vaginal Cytologic Diagnoses, .COPYRGT. 1994 Springer-Verlag, pp. 1-81.
Smith, Warren J., "Modern Optical Engineering: The Design of Optical Systems", Copyright .COPYRGT.1966 by McGraw-Hill Book Company, pp. 308-325.
Weber, J.E. et al., "Fuzzy Reasoning, Possibility Theory and Probability Theory in Expert Systems for Histopathology", IEEE/Ninth Annual Conference of the Engineering in Medicine and Biology Society, pp. 1560-1561, .COPYRGT.1987.
Wied, G.L. et al., "Expert Systems as Classifiers in Diagnostic Cytopathology", IEEE/Ninth Annual Conference of the Engineering in Medicine and Biology Society, pp. 1915-1917, .COPYRGT.1987.
Wied, G.L. et al., "Expert System Design Under Uncertainty of Human Diagnosticians", IEEE/Eighth Annual Conference of the Engineering in Medicine and Biology Society, pp. 757-760, .COPYRGT.1986.
Wied, G.L. et al., "Ticas-Stratex, and Expert Diagnostic System For Stratified Cervical Epithelium", IEEE/Ninth Annual Conference of the Engineering in Medicine and Biology Society, pp. 1557-1559, .COPYRGT.1987.
Serra, J., Image Analysis and Mathematical Morphology, pp. 372-423, Academic Press, 1982.
Patten, Jr., Stanley, "Diagnostic Cytopathology of the Uterine Cervix", Basel, Switzerland, Publisher: S. Karger, 1969, 2nd Edition 1978, Third volume in Monographs in Clinical Cytology, edited by G.L. Wied, pp. 10-15, 1-9.
Patten, Jr., Stanley, "The Automation of Uterine Cancer Cytology", Sensitivity and Specificity of Routine Diagnostic Cytology, Tutorials of Cytology, Chicago, IL, 1976, edited by Wied, Bahr and Bartels, pp. 406-419.
Lundsteen, C., et al., Abstract from Clin Genet., Department of Obstetrics and Gynecology, Rigshospitalet, Copenhagen, Denmark, vol. 45, No. 2, Feb. 1994, pp. 62-66.
Kaplow, L.S., Abstract from Histochem Cytochem., vol. 25, No. 8, Aug. 1977, pp. 990-1000.
Kuan Chih-Chau L.
Lee Shih-Jong J.
Meyer Michael G.
Wilhelm Paul S.
Johns Andrew
Moffa Emil
NeoPath, Inc.
Sun Hans I.
LandOfFree
Robustness of classification measurement apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Robustness of classification measurement apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Robustness of classification measurement apparatus and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1540871