Optics: measuring and testing – By particle light scattering
Reexamination Certificate
2009-03-17
2011-10-25
Nguyen, Sang (Department: 2886)
Optics: measuring and testing
By particle light scattering
C356S336000, C356S338000
Reexamination Certificate
active
08045161
ABSTRACT:
A coherent confocal microscope for fully characterizing the elastic scattering properties of a nanoparticle as a function of wavelength. Using a high numerical aperture lens, two-dimensional scanning and a simple vector beam shaper, the rank-2 polarizability tensor is estimated from a single confocal image. A computationally efficient data processing method is described and numerical simulations show that this algorithm is robust to noise and uncertainty in the focal plane position. The measurement of the polarizability removes the need for a priori assumptions regarding the nanoparticle shape.
REFERENCES:
patent: 4410237 (1983-10-01), Veldkamp
patent: 5235183 (1993-08-01), Whiting et al.
patent: 7119331 (2006-10-01), Chang et al.
patent: 7324280 (2008-01-01), Albert
patent: 7372562 (2008-05-01), Islam et al.
patent: 7450618 (2008-11-01), Dantus et al.
patent: 7500953 (2009-03-01), Oraevsky et al.
patent: 7528959 (2009-05-01), Novotny et al.
patent: 7639359 (2009-12-01), Chung et al.
patent: 7876359 (2011-01-01), von Flotow et al.
patent: 7876436 (2011-01-01), Chu
patent: 2004/0038264 (2004-02-01), Souza et al.
Abouraddy et al. “Three-dimensional Polarization Control in Microscopy”, Physical Review Letters, vol. 96, p. 153901-1-153901-4, 2006.
Beversluis, et al. “Programmable vector point-spread function engineering,” Optics Express vol. 14, No. 7, pp. 2650-2656, Apr. 3, 2006.
Canfield, et al. “Chirality arising from small defects in gold nanoparticle arrays,” Optics Express, vol. 14, No. 2, pp. 950-955, Jan. 23, 2006.
Cooper, et al. “Focusing of pseudorandom polarized beams,” Optics Express, vol. 13, No. 4, pp. 1066-1071 Feb. 21, 2005.
Davis, et al. “Nonparaxial vector-field modeling of topical coherence tomography and interferometric synthetic aperture microscopy,” J. Opt. Soc. Am. A, vol. 24, No. 9, pp. 2527-2542, Sep. 2007.
Davis, et al. “Spectral self-interference microscopy for low-signal nanoscale axial imaging,” J. Opt. Soc. Am. A. vol. 24, No. 11, pp. 3587-3599, Nov. 2007.
De-Castro, et al. “Registration of Translated and Rotated Images Using Finite FourierTransforms,” IEEE Trans. Pattern Analysis and Machine Intelligence, vol. PAMI-9, No. 5, pp. 700-703, Sep. 1987.
Failla, et al. “Orientational Imaging of Subwavelength Au Particles with Higher Order Laser Modes,” Nano Letters, vol. 6, No. 7, pp. 1374-1378, 2006.
Failla, et al. “Topology measurements of metal nanoparticles with 1 nm accuracy by Confocal Interference Scattering Microscopy,” Optics Express, vol. 15, vol. 14, pp. 8532-8542, Jul. 9, 2007.
Hassey, et al. “Probing the Chiroptical Response of a Single Molecule,”Science, vol. 314, No. 5804, pp. 1437-1439, Dec. 1, 2006. (Abstract only).
Kulzer, et al. “Single-Molecule Optics,” Ann. Rev. Phys. Chem. vol. 55, pp. 585-611, 2004.
Ignatovich, et al. “Real-time and Background-Free Detection of Nanoscale Particles,” Physical Review Letters, vol. 96, pp. 013901-1-013901-4, Jan. 2006.
Muhlschlegel, et al. “Resonant Optical Antennas,” Science, vol. 308, pp. 1607-1609, Jun. 10, 2005.
Patra, et al. “Defocused imaging of quantum-dot angular distribution of radiation,” Appl. Phys. Lett. 87, pp. 101103-1-101103-3, 2005.
Patra, et al. “Image Analysis of Defocused Single-Molecule Images for Three-Dimensional Molecule Orientation Studies”, J. Phys. Chem. A, vol. 108, No. 33, pp. 6836-6841, 2004.
Richards, et al. “Electromagnetic diffraction in optical systems: II. Structure of the image field in an aplanatic system,” Proceedings of the Royal Society of London, Series A, vol. 253, No. 1274, pp. 358-379, Dec. 15, 1959.
Sonnichsen, et al. “Gold Nanorods as Novel Nonbleaching Plasmon-Based Orientation Sensors for Polarized Single-Particle Microscopy”, Nano Letters, vol. 5, No. 2, pp. 301-304, 2005.
Török, et al. “Electromagnetic diffraction of light focused through a planar interface between materials of mismatched refractive indices: an integral representation,” J. Opt. Soc. Am. A, vol. 12, No. 2, pp. 325-332, Feb. 1995.
van Dijk, et al. “Absorption and scattering microscopy of single metal nanoparticles”, Phys. Chem. Chem. Phys., vol. 8, pp. 3486-3495, 2006.
Carney Paul Scott
Davis Brynmor J.
Nguyen Sang
Sunstein Kann Murphy & Timbers LLP
The Board of Trustees of the University of Illinois
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