Measuring and testing – Instrument proving or calibrating – Angle – direction – or inclination
Patent
1999-07-02
2000-10-31
Raevis, Robert
Measuring and testing
Instrument proving or calibrating
Angle, direction, or inclination
G01J 102
Patent
active
061384941
ABSTRACT:
A calibration tool and method for a robot includes a circular transparent plate with at least one reference or "symbolize" line on a planar surface of the tool and a guide groove on an edge of the tool. The size of the tool is equal to the size of a wafer to be processed by the robot. A calibration method using the tool involves placement of the tool on a wafer just before the robot is used to process the wafer, and then driving the robot to catch the tool and move it between the cassette and processing chambers. Because a non-transparent wafer is replaced by the transparent plate, it is easy to adjust the motion of the robot and record information about the motion of the robot, which can then be used to control the motion of the robot.
REFERENCES:
patent: 4988194 (1991-01-01), Hara et al.
patent: 5438418 (1995-08-01), Fukui et al.
patent: 5691812 (1997-11-01), Bates et al.
Huang Shun-Jye
Lee Chwan-Der
Raevis Robert
Taiwan Semiconductor Manufacturing Co. Ltd.
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