Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1991-02-27
1993-03-16
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324612, G01R 2700
Patent
active
051948184
ABSTRACT:
A generator provides a repetitive pattern which is applied to the input of a DUT and to the input of a timing generator. The output of the DUT follows the pattern at the input, switching the voltage between two levels. The High Frequency Voltage Sampler measures instantaneous voltage levels on the output waveform of the DUT. The timing generator uses the input signal to generate enable signals for the High Frequency Voltage Sampler which are synchronized to the test waveform and which can be time-delayed in precise intervals and with good repeatability. By placing this signal at a desired point anywhere along the test waveform the voltage at this point can be measured by the High Frequency Voltage Sampler. The High Frequency Voltage Sampler uses the leading edge of the enable signal to start the measurement of the instantaneous voltage level and it uses the trailing edge to store this level. This process is repeated, based on the sampling rate of the High Frequency Voltage Sampler, until the time delay of the enable signal is changed to another measurement point. The repetitive sampling allows the use of a voltmeter to measure the voltage when connected to the output of the High Frequency Voltage Sampler. A computer relates the measurements taken with the program steps of the timing generator to calculate the risetime or the falltime of the DUT.
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Caserza Steven F.
Harvey Jack B.
National Semiconductor Corporation
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