Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
1996-12-27
1999-03-23
Dang, Thi
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
438754, 438906, 438745, C09K 1300, H01L 2100
Patent
active
058859012
ABSTRACT:
After the resist is removed with an alkaline solution, a noncorrosive rinse solution is applied to the substrate which is composed of (a) a water-soluble monovalent lower alcohol and an organic or inorganic acid, or (b) a water-soluble monovalent lower alcohol, an organic or inorganic acid and water or (c) an organic or inorganic acid. This rinse solution prevents corrosion completely when a resist is removed from Al-Si-Cu wiring :material, which is widely used as the wiring material for high-density integrated circuits.
REFERENCES:
patent: 4087370 (1978-05-01), Singalewitch et al.
patent: 4604144 (1986-08-01), Wong
patent: 4746397 (1988-05-01), Maeda et al.
patent: 5007981 (1991-04-01), Kawasaki et al.
patent: 5248384 (1993-09-01), Liu et al.
patent: 5308745 (1994-05-01), Schwartzkopf
patent: 5376235 (1994-12-01), Langley
Gotoh Hideto
Miyazaki Masao
Mori Kiyoto
Dang Thi
Donaldson Richard L.
Kempler William B.
Texas Instruments Incorporated
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