Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-04-15
2008-04-15
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
11121824
ABSTRACT:
Testing devices at various locations on a die may be used to determine one or more properties of the locations. For example, a testing device including an oscillator such as a ring oscillator at a location may be used to determine a silicon quality, temperature, and/or voltage at the location.
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Marvell Semiconductor Israel Ltd.
Nguyen Ha Tran
Vazquez Arleen M.
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