Ring oscillator system

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S765010

Reexamination Certificate

active

11121824

ABSTRACT:
Testing devices at various locations on a die may be used to determine one or more properties of the locations. For example, a testing device including an oscillator such as a ring oscillator at a location may be used to determine a silicon quality, temperature, and/or voltage at the location.

REFERENCES:
patent: 5473259 (1995-12-01), Takeda
patent: 5619463 (1997-04-01), Malhi
patent: 5994915 (1999-11-01), Farnworth et al.
patent: 5995428 (1999-11-01), Chien et al.
patent: 6005408 (1999-12-01), Gillette
patent: 6091255 (2000-07-01), Godfrey
patent: 6105153 (2000-08-01), Yamada
patent: 6239603 (2001-05-01), Ukei et al.
patent: 6327686 (2001-12-01), Grundmann et al.
patent: 6329642 (2001-12-01), Kaneko et al.
patent: 6356490 (2002-03-01), Matsuo et al.
patent: 6415402 (2002-07-01), Bishop et al.
patent: 6515549 (2003-02-01), Nakano
patent: 6657504 (2003-12-01), Deal et al.
patent: 6759863 (2004-07-01), Moore
patent: 6958659 (2005-10-01), Nakajima
patent: 2002/0035721 (2002-03-01), Sowboda
patent: 02/054094 (2002-07-01), None

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