Ring oscillator

Oscillators – Ring oscillators

Patent

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Details

324 73R, H03B 2800, G01R 1512

Patent

active

047712511

ABSTRACT:
An improved ring oscillator for VLSI chips is shown, formed at the chip periphery. It may have specific initiation gates and have additional parasitic capacitance added to the ring to enhance accuracy. The circuit elements used for the ring are the same as those used for more centralized circuits.

REFERENCES:
patent: 4495628 (1985-01-01), Zasio
Resnick, David R., "Testability and Maintainability With a New 6K Gate Array" VLSI Design, Mar./Apr. 1983.
McCluskey, E. J., "Testing Semi-Custom Logic" Semiconductor International, Sep. 1985, pp. 118-123.
McCluskey, E. J., "Built-In Self Test Techniques" IEEE Design and Test, Apr. 1985, pp. 21-28.
McCluskey, E. J., "Built-In Self Test Structures" IEEE Design and Test, Apr. 1985, pp. 29-36.
Lake, R.; "A Fast 20K Gate Array With On-Chip Test System" VLSI System Design, Jun. 1986, pp. 1-6.
Resnick, D. R., "Checking Out VLSI With Standard Test Gear" Electronics, May 26, 1986.

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