Optics: measuring and testing – Inspection of flaws or impurities
Patent
1997-02-26
1999-08-24
Kim, Robert H.
Optics: measuring and testing
Inspection of flaws or impurities
356375, 25055934, 2505594, 25055946, 348 87, 348126, 348131, 382146, G01N 2100, G01B 1114, H04N 718, H04N 947
Patent
active
059431253
ABSTRACT:
An inspection system and method uses a ring illumination apparatus to illuminate one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The ring illumination apparatus includes a substantially ring-shaped light source that provides a substantially even illumination across the one or more reflective elements. An illumination detection device detects light beams reflecting off of the illuminated reflective elements for forming a reflected image. A method of processing the reflected image includes locating one or more edges of each reflected image element representing an illuminated reflective element. The edges of the reflected image elements are located by determining the maximum intensity gradient in the pixels forming the reflected image element. The inspection system and method thereby determines various characteristics such as the absence/presence, location, pitch, size and shape of each reflective element.
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Chouinard Jon
King Steven Joseph
Ludlow Jonathan Edmund
Schurr George
Acuity Imaging, LLC
Kim Robert H.
Merlino Amanda
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