Rigid-flex circuits with raised features as IC test probes

Details Rigid-flex circuits with raised features as IC test probes Rigid-flex circuits with raised features as IC test probes

1991-08-30

1993-11-23

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324158F, G01R 1073

Patent

active

052647870

ABSTRACT:
A circuit testing fixture is provided in which a flexible membrane (17) is provided with raised features (25) on one side arranged in the pattern of contacts (65) on a device (63) to be tested and circuit means (26) connected to a probe card (12). On the opposite side of the membrane is a support form (58), (66), (70) that is clamped in position so that it acts as a pressure pad to deflect the membrane outwardly. The support form has a planar bottom edge which may provide ridges (61) in back of the raised features (25) on the membrane (17) or recesses (68) at that location. The support form also may have a flat bottom surface (71) and may be of soft compliant material or of rigid material.

REFERENCES:
patent: 4891585 (1990-01-01), Janko et al.
patent: 4918383 (1990-04-01), Huff et al.
patent: 4975638 (1990-12-01), Evans et al.
patent: 4980637 (1990-12-01), Huff et al.

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