Rigid-flex circuits with raised features as IC test probes

Details Rigid-flex circuits with raised features as IC test probes Rigid-flex circuits with raised features as IC test probes

1993-02-24

1994-08-16

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 1073

Patent

active

053390270

ABSTRACT:
A circuit testing fixture is provided in which a flexible membrane (17) is provided with raised features (25) on one side arranged in the pattern of contacts (65) on a device (63) to be tested and circuit means (26) connected to a probe card (12). On the opposite side of the membrane is a support form (58), (66), (70) that is clamped in position so that it acts as a pressure pad to planar bottom edge which may provide ridges (61) in back deflect the membrane outwardly. The support form has a of the raised features (25) on the membrane (17) or recesses (68) at that location. The support form also may have a flat bottom surface (71) and may be of soft compliant material or of rigid material.

REFERENCES:
patent: 4065717 (1977-12-01), Kattner et al.
patent: 4972143 (1990-11-01), Kamensky et al.
patent: 4994735 (1991-02-01), Leedy

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