RFID tags calibrating backscattering period also for...

Details RFID tags calibrating backscattering period also for... RFID tags calibrating backscattering period also for...

2007-07-24

2007-07-24

Paik, Steven S. (Department: 2876)

Registers

Records

Conductive

C235S451000, C340S010200

Reexamination Certificate

active

11258521

ABSTRACT:
An RFID tag that receives a calibration instruction from a reader can determine the basic backscatter period of the symbols to be backscattered. According to some embodiments, when the instruction includes a calibration feature that is to be divided by a divide ratio, the tag measures the duration of the feature in terms of numbers of internal pulses, resulting in a binary L-number. Then at least two versions of the L-number (PR1-number, PR2-number) are combined, so as to yield the effective result of the division alternately, even when the divide ratio is a non-integer. The backscatter period can then be determined from the BP-number and the period of the internal pulses.

REFERENCES:
patent: 5453748 (1995-09-01), Lindell
patent: 5649296 (1997-07-01), MacLellan et al.
patent: 5793324 (1998-08-01), Aslanidis et al.
patent: 2004/0150510 (2004-08-01), Taki et al.
patent: 2006/0145855 (2006-07-01), Diorio et al.
patent: 2007/0013484 (2007-01-01), Carrender et al.

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