RFID device test thresholds systems and methods

Details RFID device test thresholds systems and methods RFID device test thresholds systems and methods

2007-11-13

2007-11-13

Swarthout, Brent A. (Department: 2612)

Communications: electrical

Condition responsive indicating system

Specific condition

C340S010300

Reexamination Certificate

active

11101352

ABSTRACT:
Systems and methods are disclosed herein to provide RFID device test techniques. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) device test system includes an RFID device tester adapted to test RFID devices that are disposed in a closely spaced configuration. The RFID device tester applies a variable threshold, to each of the RFID devices tested, based on characteristics of at least one of the RFID devices neighboring the RFID device being tested.

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