Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2007-05-11
2009-10-13
Dole, Timothy (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C324S636000, C324S655000
Reexamination Certificate
active
07602193
ABSTRACT:
The exemplary embodiments of the invention provide techniques that assist in the absorption, reduction or elimination of the resonance of unwanted cavity modes in a cavity measurement system, such as a cylindrical TE0,ncavity measurement system used to measure various dielectric properties of a dielectric sample, for example. One non-limiting, exemplary system includes: sidewalls; a first endplate; a second endplate disposed opposite the first endplate so as to define a cavity bounded by the sidewalls, the first endplate and the second endplate; and first and second radio frequency (RF) coupling receptacles coupled to at least one of the sidewalls, the first endplate or the second endplate, wherein the first and second RF coupling receptacles are configured to pass a RF signal through the cavity. The first endplate has a plurality of conducting loops disposed on a surface facing the second endplate. Each loop of the plurality of conducting loops is electrically isolated from other loops of the plurality of conducting loops.
REFERENCES:
patent: 2756389 (1956-07-01), Stinehelfer
patent: 3250985 (1966-05-01), Hyde
patent: 4429656 (1984-02-01), Weisenberger
Janezic, M. D. et al., “Relative Permittivity and Loss Tangent Measurement using NIST 60 mm Cylindrical Cavity,” Aug. 2005, 66 pp., National Institute of Standards and Technology (NIST) Special Publication 260-159.
Baker-Jarvis, J. et al., “Dielectric Characterization of Low-Loss Materials A Comparison of Techniques,” Aug. 4, 1998, pp. 571-577, IEEE Transactions on Dielectrics and Electrical Insualtion, vol. 5, No. 4.
Jeffries, D., “Waveguides and Cavity Resonators,” Jan. 14, 2005, 10 pp.
Vankatesh, M.S. et al., “An overview of dielectric properties measuring techniques,” 2005, 4 pp., Canadian Biosystems Engineering, vol. 47.
Coakley, K. J. et al., “Estimation of Q-Factors and Resonant Frequencies,” Mar. 2003, pp. 862-868, IEEE Transactions on Microwave Theory and Techniques, vol. 51, No. 3.
Janezic, M. D. et al., “Relative Permittivity and Loss Tangent Measurement using NIST 60 mm Cylindrical Cavity,” Aug. 2005, 66 pp., National Institute of Standards and Technology (NIST) Special Publication 260-159.
Baker-Jarvis, J. et al., “Dielectric Characterization of Low-Loss Materials A Comparison of Techniques,” Aug. 4, 1998, pp. 571-577, IEEE Transactions on Dielectrics and Electrical Insulation, vol. 5, No. 4.
Baird J. Mark
Corey Darren J.
Dole Timothy
Harrington & Smith PC
Hoque Farhana
L-3 Communications Corporation
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