Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-03-25
1995-05-09
Nguyen, Vinh
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324751, G01R 3102, G01R 1073
Patent
active
054143721
ABSTRACT:
A reusable carrier is employed to permit burn-in and testing of loose die for integrated chip modules. This is accomplished by providing a carrier and an insert, both made of electrically insulating material in a generally rectangular form, with upper and lower co-planar surfaces. The upper surface of the carrier has a cavity in it, which is dimensioned to hold the insert. The insert, in turn, has an aperture in it dimensioned to hold the die under test. The die is set into the aperture of the insert which is placed in the cavity, and a bumped flex circuit is placed over the insert/die/carrier assembly. Alignment pins register the flex circuit with the carrier. The upper surface of the carrier has a number of contact pads on it; and connections are made between bonding pad contacts on the face of the die and these contact pads in accordance with the flex circuit interconnections. A rubber-backed pressure plate is placed over the flex circuit, and spring clips provide the necessary pressure to maintain the electrical contacts between the bonding pads and the contact pads. The entire assembly is treated as a single package for burn-in and testing of the die.
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Nguyen Vinh
Ptak LaValle D.
VLSI Technology Inc.
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