Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1996-01-18
1997-09-30
Karlsen, Ernest F.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324617, 379 6, G01R 2320, H04B 346
Patent
active
056729740
ABSTRACT:
A returned reference compatible straightaway envelope delay measuring instrument and a related method use a sinewave generator to produce an envelope and a low frequency reference oscillator for modulating amplitude of the envelope. The low frequency modulated envelope signal is transmitted over a transmission path to an envelope detector, which detects the envelope. A phase detector connected to the envelope detector and to a local similar low frequency reference oscillator detects phase difference between the low frequency modulating oscillation in the envelope and a local reference oscillator signal. A processor makes a series of delay measurements and computes the delay difference between the start delay measurement and the end delay measurement. The total delay difference, which represents the drift error between the envelope modulation oscillator and the local reference oscillator, is then separated out from the series of measurements taken between the start and end by subtracting from each measurement an appropriate portion of the total delay difference based on the proportion of time of each measurement to the total time.
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Convex Corporation
Creighton Wray James
Do Diep
Karlsen Ernest F.
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