Optics: measuring and testing – Refraction testing – Schlieren effect
Patent
1994-02-01
1996-05-07
Pham, Hoa G.
Optics: measuring and testing
Refraction testing
Schlieren effect
G01N 2141
Patent
active
055151582
ABSTRACT:
A retroreflective type focusing schlieren system which permits the light source to be positioned on the optic side of the system. The system includes an extended light source, as opposed to a point source, located adjacent a beam splitter which projects light through the flow field onto a reflecting grating in the form of a grid which generates sheets of light that are directed back through the flow field and the beam splitter onto a primary lens behind which is located a cut-off grid having a grid pattern which corresponds to the grid pattern of the reflecting grating. The cut-off grid is adjustably positioned behind the primary lens and an image plane for imaging the turbulence is adjustably located behind the cut-off grid.
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Miller Guy
Pham Hoa G.
The United States of America as Represented by the Administrator
Warsh Kenneth L.
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