Retro-reflective target wafer for a position determination...

Geometrical instruments – Straight-line light ray type – Rod or target

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C033S203180, C033S288000

Reexamination Certificate

active

07373726

ABSTRACT:
A target that is usable in a position determination system such as, for example, a wheel alignment system, is structurally stable over wide temperature ranges, protected from humidity and chemical contamination, and not subject to breakage. A layered target structure includes a substrate board, a retro-reflective layer formed on the substrate board, a transparent sheet overlaying the retro-reflective layer, and an opaque patterned layer between the a retro-reflective layer and the transparent sheet. The layered target structure may be secured a support assembly.

REFERENCES:
patent: 4343550 (1982-08-01), Buckley et al.
patent: 4863819 (1989-09-01), Drexler et al.
patent: 5073005 (1991-12-01), Hubbs
patent: 5202168 (1993-04-01), Turner et al.
patent: 5532816 (1996-07-01), Spann et al.
patent: 5535522 (1996-07-01), Jackson et al.
patent: 5724743 (1998-03-01), Jackson et al.
patent: 5943783 (1999-08-01), Jackson
patent: 6134792 (2000-10-01), January
patent: 6148528 (2000-11-01), Jackson
patent: 6526665 (2003-03-01), Jackson
patent: 6839972 (2005-01-01), Jackson et al.
patent: 6931736 (2005-08-01), Stopa
patent: 7089776 (2006-08-01), Dale, Jr.
patent: 2002/0034320 (2002-03-01), Mann
patent: 2004/0080949 (2004-04-01), Klotz et al.
patent: 2004/0139620 (2004-07-01), Stopa
patent: 2005/0060899 (2005-03-01), Jackson et al.
Hunter Engineering Co. Product Literature, Form No. 4240T, “DSP400 Alignment Senors”, dated Jan. 1999, consisting of 5 folded pages.
International Search Report for International Application PCT/US2006/042072 Completed Feb. 27, 2007.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Retro-reflective target wafer for a position determination... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Retro-reflective target wafer for a position determination..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Retro-reflective target wafer for a position determination... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2815420

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.