Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reexamination Certificate
2007-09-18
2007-09-18
Dang, Hung Xuan (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
C351S246000
Reexamination Certificate
active
10554944
ABSTRACT:
It is possible to improve the quality of an image of an eyeground, thereby acquiring an optimal image. An eyeground observation system (3) acquires an eyeground image via a compensation optical section (70) correcting the image of the eyeground obtained by illumination of an eyeground illumination system (2). A wave front correction system (1) measures wave front measurement data including a wave front aberration of the eye to be checked and/or aberration to be corrected, thereby acquiring the optical characteristic of the eye to be checked. An image data formation section (14-2) performs simulation of viewing at the eyeground, thereby calculating the simulation image data or MTF data. A correction amount decision section (14-3) decides a correction amount according to a voltage change template stored in a memory (14-4) and outputs it to a control section (15). Moreover, the correction amount decision section (14-3) uses the simulation result for a plurality of voltage change templates so as to calculate a value indicating the matching degree of the pattern or MTF data corresponding to a spatial frequency of cells of the eyeground and decide an appropriate correction amount
REFERENCES:
patent: 6695450 (2004-02-01), Hirohara et al.
patent: 2001-095760 (2001-04-01), None
patent: 2001-507258 (2001-06-01), None
patent: 2002-209854 (2002-07-01), None
patent: 2003-111729 (2003-04-01), None
patent: 2003-116792 (2003-04-01), None
patent: WO 01/47407 (2001-07-01), None
H. Uozato, “Ophthalmology Application of Adaptive Optics, Practical Ophthalmology”, 2001, vol. 4, No. 6, p. 114-116.
Mihashi Toshifumi
Yamaguchi Tatsuo
Dang Hung Xuan
Foley & Lardner LLP
Kabushiki Kaisha Topcon
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