Reticle system for manufacturing integrated circuit systems

Radiation imagery chemistry: process – composition – or product th – Plural exposure steps

Reexamination Certificate

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Reexamination Certificate

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07867698

ABSTRACT:
A reticle system that includes: providing a reticle system; and assigning two or more of an image pattern onto the reticle system to form one or more layers of an integrated circuit system by grouping and pairing each of the image pattern onto the reticle system according to a multi-layer reticle grouping/pairing flow.

REFERENCES:
patent: 6646722 (2003-11-01), Pierrat
patent: 6710851 (2004-03-01), Elmer et al.
patent: 6968532 (2005-11-01), Sivakumar et al.
patent: 7480889 (2009-01-01), Abrams et al.
patent: 7539962 (2009-05-01), Kyoh
Yamamoto, Yasuhisa et al., Multi-layer reticle (MLR) strategy application to double-patterning/double-exposure for better overlay error control and mask cost reduction, Photomask Technology 2007, Robert J. Naber; Hiroichi Kawahira, Editors, pp. 67302(x), vol. 6730.

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