Reticle stages for lithography systems and lithography methods

Photocopying – Projection printing and copying cameras – Detailed holder for original

Reexamination Certificate

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C355S053000

Reexamination Certificate

active

07626682

ABSTRACT:
Reticle stages for lithography systems and lithography methods are disclosed. In a preferred embodiment, a lithography reticle stage includes a first region adapted to support a first reticle, and at least one second region adapted to support a second reticle.

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“ASML: 193nm Immersion Lithography,” International Sematech Litho Forum, http://www.sematech.org/resources/litho/meetings/forum/20040128/index.htm, Jan. 28, 2004, 22 pp., Sematech, Inc., Los Angeles, CA.
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Owa, S., et al., “Update on 193nm Immersion Exposure Tool,” International Sematech Litho Forum, http://www.sematech.org/resources/litho/meetings/forum/20040128/index.htm, Jan. 28, 2004, 51 pp., Sematech, Inc., Los Angeles, CA.
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