Retention of test probes in translator fixtures

Details Retention of test probes in translator fixtures Retention of test probes in translator fixtures

1994-08-16

1996-02-20

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324761, 324 731, G01R 106

Patent

active

054932300

ABSTRACT:
A translator pin retention system for a translator fixture for a printed circuit board tester having a pattern of test probes facing away from a base plate upon which the translator fixture is mounted. The fixture comprises a plurality of essentially parallel and spaced apart translator plates having patterns of preformed holes for containing and supporting straight, solid translator pins extending through the plates of the translator fixture for use in translating test signals between test points on a printed circuit board supported by the fixture and the test probes on the base of the tester. A thin, flexible pin retention sheet of an elastomeric material rests on one of the translator plates so that the translator pins that extend through the translator plate on which the sheet rests also extend through the pin retention sheet. The pin retention sheet has a preformed pattern of flexible slotted openings undersized with respect to the size of the translator pins which extend through the pin retention sheet so that the elastomeric properties of the pin retention sheet naturally apply a compression force around the translator pins to retain the pins in the fixture. The pin retention sheet is freely movable independently of the translator plate on which it rests so that the compression force acting on the pins essentially avoids drag forces or any restriction to axial movement of the pins within the fixture.

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"Multiprobe Testing Device," by Eddy, IBM Tech. Disc. Bull. vol. 12, #4, Sep. 1969, p. 539.
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