Resource matrix, system, and method for operating same

Details Resource matrix, system, and method for operating same Resource matrix, system, and method for operating same

2007-08-28

2007-08-28

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S763010, C324S1540PB, C714S724000, C200S182000

Reexamination Certificate

active

11264577

ABSTRACT:
In one embodiment, a resource matrix is provided with a first set of pins, a second set of pins, and at least one programmable switching circuit. The first set of pins electrically couples the resource matrix with a tester resource. The second set of pins electrically couples the resource matrix with a plurality of test areas. The at least one programmable switching circuit selectively couples each one of the first set of pins to different ones of the second set of pins. In one embodiment, the at least one programmable switching circuit includes a set of multiplexers. In another embodiment, the at least one programmable switching circuit includes a set of LIMMS. In another embodiment, a system is disclosed for testing a plurality of test areas with a tester resource and a resource matrix. Methods for routing signals between a tester resource and plurality of test areas are also disclosed.

REFERENCES:
patent: 6787719 (2004-09-01), Wong
patent: 6847203 (2005-01-01), Conti et al.
patent: 2005/0212542 (2005-09-01), Brown
“Demonstration of the Agilent V5500 with Matrix”, www.ate.agilent.com/ext—images/e-mail/AM—001—V5500/V5500demo.html, Sep. 28, 2005, 1 page.
Agilent Versatest Series Model V5500—Product Overview, Agilent Technologies, Jun. 28, 2005, 8 pages.
Agilent Versatest Series Model V5400, Agilent Technologies, Sep. 28, 2005, 3 pages.
Agilent Versatest Series Model V5500, Agilent Technologies, Sep. 28, 2005, 6 pages.
“Memory Test”, Agilent Technologies, Sep. 15, 2005, 3 pages.

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