Resonant frequency measuring device for gauging coating thicknes

Details Resonant frequency measuring device for gauging coating thicknes Resonant frequency measuring device for gauging coating thicknes

1975-11-07

1977-01-25

Strecker, Gerard

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

G01R 3300, G01R 3312

Patent

active

040053598

ABSTRACT:
An electronic thickness gauge for measuring the coating thickness over magnetic and over conductive, non-magnetic substrates by measuring the movement of the low-frequency hump in the response curve for an over-coupled, double-tuned, open-faced transformer when the above-mentioned substrates are placed across the gap between the transformer pole-faces.

REFERENCES:
patent: 1792249 (1931-02-01), Serduke
patent: 2154156 (1939-04-01), Turner et al.
patent: 2189092 (1940-02-01), Urmenyi
patent: 2237254 (1941-04-01), Broekhuysen
patent: 2267884 (1941-12-01), Zuschlag
patent: 2572908 (1951-10-01), Brenholdt
patent: 2875429 (1959-02-01), Quade
Hoel, J. E., Magnetic Reluctance, Film Thickness Gauge, IBM Tech. Discl. Bull., vol. 13, No. 10, Mar. 1971, pp. 3048, 3049.

Affiliated with

Also associated with

Rating

Resonant frequency measuring device for gauging coating thicknes does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Resonant frequency measuring device for gauging coating thicknes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Resonant frequency measuring device for gauging coating thicknes will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1480807