Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2007-08-24
2010-12-07
Larkin, Daniel S (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
Reexamination Certificate
active
07845215
ABSTRACT:
A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create images of nanoscale near-surface and subsurface features.
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Cantrell John H.
Cantrell Sean A.
Edwards Robin W.
Larkin Daniel S
The United States of America as represented by the Administrator
Warmbier Andrea Z.
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