Resistor isolated burn-in socket board

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 73PC, 439525, 439620, G01R 3102, H05K 118

Patent

active

047257750

ABSTRACT:
An improved semiconductor burn-in socket assembly board test device includes a plurality of sockets having apertures formed in the cavity bottoms, spring clip type female connectors rigidly mounted in the socket cavities for engaging male connector pins of semiconductor devices (dual-in-line packages, for example), and male connector pins depending from the cavity bottoms. Cermet resistors are rigidly fixed within the cavity bottom apertures, and soldered to the female and male connectors whereby a semiconductor burn-in test board is provided having isolation resistors vertically disposed with respect to the socket's female and male connectors and within the thickness of the socket bottoms.

REFERENCES:
patent: 3880493 (1975-04-01), Lockhart, Jr.
patent: 4326765 (1982-04-01), Brancaleone
patent: 4405188 (1983-09-01), Schwartz
patent: 4428633 (1984-01-01), Lundergan et al.
patent: 4478476 (1984-10-01), Jones
Dougherty, R. A.; "DIP Switch Isolates Faults In System; Electronics; May 15, 1975; p. 112.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Resistor isolated burn-in socket board does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Resistor isolated burn-in socket board, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Resistor isolated burn-in socket board will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2222704

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.