Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-04-10
2007-04-10
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
11018133
ABSTRACT:
A test probe tip constructed substantially from resistive material. The resistive material is made of resistive conducting material substantially enclosed in and dispersed throughout encapsulating material. The test probe has a probing end for probing electronic circuitry and a connection end for interfacing with a probing head. The resistive conducting material forms at least one path through the encapsulating material from the probing end to the connection end. The resistive conducting material may be a plurality of longitudinally extending resistive/conductive members or a plurality of particulate resistive/conductive members.
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Campbell Julie A.
Jacobs Lawrence W.
Isla-Rodas Richard
Law Office of Karen Dana Oster LLC
LeCroy Corporation
Nguyen Ha Tran
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