Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1992-08-14
1994-09-27
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324713, 374172, 374183, G01R 2714
Patent
active
053510100
ABSTRACT:
An apparatus and method for determining a characteristic of a resistor and/or an environment occurring as a voltage across a measuring resistor (e.g., a voltage across a temperature-dependent resistor) by comparing it with a reference value that occurs as a voltage across a reference resistor (e.g., a voltage across a temperature-stabilized reference resistor) to determine, for example, temperature. A total of four voltages are measured. That is, positive and negative currents are passed through the measuring resistor and the resulting first and second voltages across the measuring resistor are detected. Positive and negative currents then are passed through the reference resistor and the resulting third and fourth voltages across the reference resistor are detected. The difference between the first and second voltage and the third and fourth voltages is determined to eliminate the effect of thermo-electric voltages in the lines to the resistors and the lines of the contact terminals in the switches. From these differences, a quotient is calculated that represents the characteristic of the measuring resistor and the environment.
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Taylor et al., "A Microcomputer-Based Instrument for Application in Platinum Resistance Thermometry", Journal of Physics E. Scientific Instruments, Bd. 16, Nr. 11, Nov. 1983 Bristol GB, Seiten 1100-1104.
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Leopold Hans
Schrocker Klaus P.
Stabinger Hans
Leopold Hans
Stabinger Hans
Tobin Christopher M.
Wieder Kenneth A.
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