Resistance measurement in an active and high temperature environ

Details Resistance measurement in an active and high temperature environ Resistance measurement in an active and high temperature environ

1990-03-30

1991-12-17

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

219497, 324602, 324691, G01R 2708

Patent

active

050737589

ABSTRACT:
A circuit and method for measuring resistance in an active and high temperature environment is provided using a low frequency square wave as an input. The square wave input is fed through the unit under test into a full-wave rectifier and RMS circuit. The full-wave rectifier and averaging circuit cancel out errors caused by the Seebeck effect and noise. The resulting d.c. signal is proportional to the resistance of the unit under test and can be displayed.

REFERENCES:
patent: 4264860 (1981-04-01), Thebault
patent: 4390769 (1983-06-01), Steigerwald
patent: 4498044 (1985-02-01), Horn
patent: 4639569 (1987-01-01), Dufrenne
patent: 4963830 (1990-10-01), Roth et al.

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