Resin composition for encapsulating semiconductor device

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Assembly of plural semiconductive substrates each possessing...

Reexamination Certificate

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Details

C428S413000, C428S414000, C428S416000, C523S440000, C523S443000, C523S457000, C523S458000, C523S466000

Reexamination Certificate

active

10941883

ABSTRACT:
A resin composition usable for encapsulating a semiconductor, comprising (A) an epoxy resin having two or more epoxy groups in one molecule; (B) a curing agent; and (C) inorganic composite oxide particles constituted by silicon dioxide and at least one metal oxide selected from the group consisting of oxides of metal atoms belonging to Group III and Group IV of the Periodic Table excluding silicon; a semiconductor device comprising a wiring circuit board, a semiconductor element, and the above resin composition; and a method for manufacturing a semiconductor device comprising the steps of adhering a resin sheet comprising the resin composition of claim 1 and a stripping sheet to a semiconductor circuit side of a bump-mounting wafer, removing the stripping sheet leaving only the resin composition to the wafer, and cutting the wafer into individual chips.

REFERENCES:
patent: 5175199 (1992-12-01), Asano et al.
patent: 7109591 (2006-09-01), Hack et al.
patent: 2002/0058145 (2002-05-01), Kanamaru et al.
patent: 2002/0058742 (2002-05-01), Honda et al.
patent: 6-65475 (1994-03-01), None
patent: 11-74424 (1999-03-01), None
patent: 2001-144120 (2001-05-01), None
patent: 2002-088222 (2002-03-01), None
patent: 2002-118147 (2002-04-01), None
patent: 2003-138100 (2003-05-01), None
Machine translation of JP 2002-118147.
Machine translation of JP 06-065475.
Machine translation of JP 11-074424.

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