Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-12-05
2006-12-05
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07145354
ABSTRACT:
An apparatus for electrical testing having probes (201) constructed of metal elements (201a) of about equal size bonded together in substantially linear sequence. Further an insulating holder (202) having first and second surfaces and a plurality of metal-filled vias (210) traversing the holder from the first to the second surface; the vias form contact pads on the first and second surfaces. The contact pads (210a) of the first holder surface have a probe attached so that the probe is positioned about normal to the surface. A sheet (203) of resilient insulating material, which has first and second surfaces and a thickness traversed by a plurality of conducting traces (220), has its first sheet surface attached to the second holder surface so that at least one of the traces contacts one of the contact pads, respectively, to provide an electrical path to the second sheet surface. A printed circuit board, suitable for insertion into an electrical test apparatus, is attached to the second sheet surface so that a continuous electrical path is established from the apparatus to each of the probes.
REFERENCES:
patent: 5940278 (1999-08-01), Schumacher
patent: 6204681 (2001-03-01), Nagatsuka et al.
patent: 6215321 (2001-04-01), Nakata
patent: 6820794 (2004-11-01), Olsen
Reynaldo M. Rincon, et al. “Multiple-Chip Probe and Universal Tester Contact Assemblage” U.S. Appl. No. 09/915,919, filed Jul. 26, 2001.
Brady III Wade James
Hollington Jermele
Nguyen Tung X.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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