Residual signal alert generation for condition monitoring...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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C702S179000, C703S007000

Reexamination Certificate

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06975962

ABSTRACT:
A system and method for monitoring a condition of a monitored system. Estimates of monitored parameters from a model of the system provide residual values that can be analyzed using a sequential probability ratio test (“SPRT”). The invention employs empirically derived distributions in the SPRT to provide more accurate and sensitive alerts of impending faults, breakdowns and process deviations. The distributions can be generated from piecewise continuous approximation or spline functions based on the actual distribution of residual data to provide improved computational performance. The distributions can be provided before monitoring, or can be updated and determined during monitoring in an adaptive fashion.

REFERENCES:
patent: 3045221 (1961-07-01), Roop
patent: 4060716 (1977-11-01), Pekrul et al.
patent: 4336595 (1982-06-01), Adams et al.
patent: 4402054 (1983-08-01), Osborne et al.
patent: RE31750 (1984-11-01), Morrow
patent: 4480480 (1984-11-01), Scott et al.
patent: 4639882 (1987-01-01), Keats
patent: 4707796 (1987-11-01), Calabro et al.
patent: 4761748 (1988-08-01), Le Rat et al.
patent: 4796205 (1989-01-01), Ishii et al.
patent: 4823290 (1989-04-01), Fasack et al.
patent: 4937763 (1990-06-01), Mott
patent: 4965513 (1990-10-01), Haynes et al.
patent: 4978909 (1990-12-01), Hendrix et al.
patent: 4985857 (1991-01-01), Bajpai et al.
patent: 5003950 (1991-04-01), Kato et al.
patent: 5025499 (1991-06-01), Inoue et al.
patent: 5052630 (1991-10-01), Hinsey et al.
patent: 5093792 (1992-03-01), Taki et al.
patent: 5113483 (1992-05-01), Keeler et al.
patent: 5119287 (1992-06-01), Nakamura et al.
patent: 5123017 (1992-06-01), Simpkins et al.
patent: 5195046 (1993-03-01), Gerardi et al.
patent: 5210704 (1993-05-01), Husseiny
patent: 5223207 (1993-06-01), Gross et al.
patent: 5251285 (1993-10-01), Inoue et al.
patent: 5285494 (1994-02-01), Sprecher et al.
patent: 5309351 (1994-05-01), McCain et al.
patent: 5311562 (1994-05-01), Palusamy et al.
patent: 5325304 (1994-06-01), Aoki
patent: 5327349 (1994-07-01), Hoste
patent: 5386373 (1995-01-01), Keeler et al.
patent: 5410492 (1995-04-01), Gross et al.
patent: 5414632 (1995-05-01), Mochizuki et al.
patent: 5420571 (1995-05-01), Coleman et al.
patent: 5421204 (1995-06-01), Svaty, Jr.
patent: 5445347 (1995-08-01), Ng
patent: 5446671 (1995-08-01), Weaver et al.
patent: 5446672 (1995-08-01), Boldys
patent: 5455777 (1995-10-01), Fujiyama et al.
patent: 5459675 (1995-10-01), Gross et al.
patent: 5481647 (1996-01-01), Brody et al.
patent: 5486997 (1996-01-01), Reismiller et al.
patent: 5495168 (1996-02-01), de Vries
patent: 5496450 (1996-03-01), Blumenthal et al.
patent: 5500940 (1996-03-01), Skeie
patent: 5502543 (1996-03-01), Aboujaoude
patent: 5539638 (1996-07-01), Keeler et al.
patent: 5548528 (1996-08-01), Keeler et al.
patent: 5553239 (1996-09-01), Heath et al.
patent: 5559710 (1996-09-01), Shahraray et al.
patent: 5566092 (1996-10-01), Wang et al.
patent: 5579232 (1996-11-01), Tong et al.
patent: 5586066 (1996-12-01), White et al.
patent: 5596507 (1997-01-01), Jones et al.
patent: 5600726 (1997-02-01), Morgan et al.
patent: 5602733 (1997-02-01), Rogers et al.
patent: 5608845 (1997-03-01), Ohtsuka et al.
patent: 5612886 (1997-03-01), Weng
patent: 5617342 (1997-04-01), Elazouni
patent: 5623109 (1997-04-01), Uchida et al.
patent: 5629878 (1997-05-01), Kobrosly
patent: 5638413 (1997-06-01), Uematsu et al.
patent: 5657245 (1997-08-01), Hecht et al.
patent: 5663894 (1997-09-01), Seth et al.
patent: 5668944 (1997-09-01), Berry
patent: 5671635 (1997-09-01), Nadeau et al.
patent: 5680409 (1997-10-01), Qin et al.
patent: 5680541 (1997-10-01), Kurosu et al.
patent: 5682317 (1997-10-01), Keeler et al.
patent: 5708780 (1998-01-01), Levergood et al.
patent: 5710723 (1998-01-01), Hoth et al.
patent: 5727144 (1998-03-01), Brady et al.
patent: 5737228 (1998-04-01), Ishizuka et al.
patent: 5748469 (1998-05-01), Pyötsiä
patent: 5748496 (1998-05-01), Takahashi et al.
patent: 5751580 (1998-05-01), Chi
patent: 5754451 (1998-05-01), Williams
patent: 5757309 (1998-05-01), Brooks et al.
patent: 5761090 (1998-06-01), Gross et al.
patent: 5764509 (1998-06-01), Gross et al.
patent: 5774379 (1998-06-01), Gross et al.
patent: 5784285 (1998-07-01), Tamaki et al.
patent: 5787138 (1998-07-01), Ocieczek et al.
patent: 5817958 (1998-10-01), Uchida et al.
patent: 5818716 (1998-10-01), Chin et al.
patent: 5822212 (1998-10-01), Tanaka et al.
patent: 5841677 (1998-11-01), Yang et al.
patent: 5842157 (1998-11-01), Wehhofer et al.
patent: 5864773 (1999-01-01), Barna et al.
patent: 5886913 (1999-03-01), Marguinaud et al.
patent: 5895177 (1999-04-01), Iwai et al.
patent: 5905989 (1999-05-01), Biggs
patent: 5909368 (1999-06-01), Nixon et al.
patent: 5913911 (1999-06-01), Beck et al.
patent: 5930156 (1999-07-01), Kennedy
patent: 5930779 (1999-07-01), Knoblock et al.
patent: 5933352 (1999-08-01), Salut
patent: 5933818 (1999-08-01), Kasravi et al.
patent: 5940298 (1999-08-01), Pan et al.
patent: 5946661 (1999-08-01), Rothschild et al.
patent: 5946662 (1999-08-01), Ettl et al.
patent: 5950147 (1999-09-01), Sarangapani et al.
patent: 5956487 (1999-09-01), Venkatraman et al.
patent: 5961560 (1999-10-01), Kemner
patent: 5987399 (1999-11-01), Wegerich et al.
patent: 5993041 (1999-11-01), Toba
patent: 6006192 (1999-12-01), Cheng et al.
patent: 6006260 (1999-12-01), Barrick, Jr. et al.
patent: 6021396 (2000-02-01), Ramaswamy et al.
patent: 6029097 (2000-02-01), Branicky et al.
patent: 6049741 (2000-04-01), Kawamura
patent: 6049827 (2000-04-01), Sugauchi et al.
patent: 6076088 (2000-06-01), Paik et al.
patent: 6088626 (2000-07-01), Lilly et al.
patent: 6104965 (2000-08-01), Lim et al.
patent: 6110214 (2000-08-01), Klimasauskas
patent: 6115653 (2000-09-01), Bergström et al.
patent: 6125351 (2000-09-01), Kauffman
patent: 6128540 (2000-10-01), Van Der Vegt et al.
patent: 6128543 (2000-10-01), Hitchner
patent: 6141647 (2000-10-01), Meijer et al.
patent: 6144893 (2000-11-01), Van Der Vegt et al.
patent: 6182022 (2001-01-01), Mayle et al.
patent: 6587737 (2003-07-01), Voser et al.
patent: 6609036 (2003-08-01), Bickford
patent: 2002/0055826 (2002-05-01), Wegerich et al.
patent: 2003/0125248 (2003-07-01), Hair et al.
patent: 2003/0126258 (2003-07-01), Conkright et al.
patent: WO 00/67412 (2000-11-01), None
“MSET Modeling Of Crystal River-3 Venturi Flow Meters” by J. P. Herzog, S. W. Wegerich, K. C. Gross, and F. K. Bockhorst, 6th International Conference on Nuclear Engineering, ICONE-6169, May 10-14, 1998, Copyright ©1998 ASME (12 pp).
“Application Of A New Technique For Modeling System Behavior” by Paul J. O'Sullivan, presented at the ISA Symposium, Edmonton, Alberta, May 1, 1991, ©Copyright 1991 Instrument Society of America (21 pp).
“A Universal, Fault-Tolerant, Non-Linear Analytic Network For Modeling And Fault Detection,” by J. E. Mott, R. W. King, L.R. Monson, D. L. Olson and J. D. Staffon, Proceedings of the 8th Power Plant Dynamics, Control & Testing Symposium, Knoxville, Tennessee, May 27-29, 1992 (14 pp).
ModelWare™ Product Review by Robert D. Flori, reprinted from Computerized Investing, Sep./Oct. 1992, vol. XI, No. 5, copyright by The American Association of Individual Investors (pp. 8-10).
ModelWare™A New Approach to Prediction by Ken Tucker, reprinted from PC AI magazine, Jan./Feb. 1993, pp. 14, 15, 30.
“Similiarity Based Regression: Applied Advanced Pattern Recognition to Power Plant Analysis,” by E. J. Hansen and M. B. Caudill, presented at the 1994 EPRI Heat Rate Improvement Conference (9 pp).
“Applied Pattern Recognition For Plant Monitoring And Data Validation,” by Ron Griebenow, E. J. Hansen, and A. L. Sudduth, presented at the Fifth International Joint ISA POWID/EPRI Controls and Instrumentation Conference, La Jolla, California, Jun. 19-21, 1995 (11 pp).
“A Fault-Tolerant Sensory Diagnostic System For Intelligent Vehicle Application” by Ralph M. Singer, Kenny C. Gross, and Stephan Wegerich, presented at the IEEE International Symposium on

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