Repeat defect detector system

Optics: measuring and testing – By monitoring of webs or thread – For flaws or imperfections

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250563, G01N 2132, G01N 2116

Patent

active

041346840

ABSTRACT:
A flaw detection system is provided in which a source of radiation is scanned across a web of moving material being examined for repeat defects. The web is divided into lanes for processing purposes, and flaw information derived from the surface of material being examined is processed to provide a two-coordinate matrix location (lane and down-web), which is stored. This circuitry without the matrix outputs has other applications. Separation distances of a repeat flaw in the same lane are compared with a predetermined list, and if a match occurs, future flaw locations are projected in that lane. A repetition of a predetermined number of flaw repeats in a given lane signals an alarm. A predetermined number of misses in a row will result in the clearing of that lane of the particular flaw that failed to repeat.

REFERENCES:
patent: 3781117 (1973-12-01), Laycak et al.
patent: 3898469 (1975-08-01), Nichols et al.
patent: 3958127 (1976-05-01), Faulhaber et al.
patent: 3980891 (1976-09-01), Slaker

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Repeat defect detector system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Repeat defect detector system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Repeat defect detector system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-649608

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.