Repeat defect detector system

Details Repeat defect detector system Repeat defect detector system

1977-01-18

1979-01-16

McGraw, Vincent P.

Optics: measuring and testing

By monitoring of webs or thread

For flaws or imperfections

250563, G01N 2132, G01N 2116

Patent

active

041346840

ABSTRACT:
A flaw detection system is provided in which a source of radiation is scanned across a web of moving material being examined for repeat defects. The web is divided into lanes for processing purposes, and flaw information derived from the surface of material being examined is processed to provide a two-coordinate matrix location (lane and down-web), which is stored. This circuitry without the matrix outputs has other applications. Separation distances of a repeat flaw in the same lane are compared with a predetermined list, and if a match occurs, future flaw locations are projected in that lane. A repetition of a predetermined number of flaw repeats in a given lane signals an alarm. A predetermined number of misses in a row will result in the clearing of that lane of the particular flaw that failed to repeat.

REFERENCES:
patent: 3781117 (1973-12-01), Laycak et al.
patent: 3898469 (1975-08-01), Nichols et al.
patent: 3958127 (1976-05-01), Faulhaber et al.
patent: 3980891 (1976-09-01), Slaker

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